005600000a22001690004500020001500000060000800015082001600023100002100039245007700060260003400137260000900171300000800180650006200188942000700250999001900257952011400276  a0824715535  a100  a578. 45 MUR  aMurr, Lawrence E  aElectron & Ion microscopy and microanalysis: Principles and applications  aNew York, Marcel Dekker, Inc.  c1982  a793  aElectrons/ Ions/ Electron emission/ Ionization microscopy  cBK  c351020d351020  00104070aKAUCOAVbKAUCOAVd2014-05-02l0o578. 45 MURpKAU_COAV-20083r2014-05-02 00:00:00w2014-05-02yBK