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Electron & Ion microscopy and microanalysis: Principles and applications
Publication details: New York, Marcel Dekker, Inc.; 1982Description: 793ISBN:- 0824715535
- 578. 45 MUR
- 100
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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Books (General)
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College of Agriculture, Vellayani | 578. 45 MUR (Browse shelf(Opens below)) | Available | KAU_COAV-20083 |
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